The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 25, 2012
Filed:
Dec. 04, 2007
Applicant:
Neil Colin Campbell, Cambridge, GB;
Inventor:
Neil Colin Campbell, Cambridge, GB;
Assignee:
MStar Semiconductor, Inc., Hsinchu Hsien, TW;
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H04B 17/00 (2006.01);
U.S. Cl.
CPC ...
Abstract
A method of calculating the noise power in a received signal containing a pilot channel, the method comprising estimating the power of the received signal, estimating the power of the pilot channel and calculating the noise power as a function of the estimated signal and the pilot channel powers. The noise power thus deduced may be used as a parameter of a function defining a channel quality indicator. The invention extends to corresponding apparatus.
Campbell, Neil. (2012). Noise based quality estimation for signals (U.S. Patent No. 8340611). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/8340611
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile