The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 25, 2012

Filed:

Sep. 18, 2009
Applicants:

John Nielsen, Calgary, CA;

Gerard Lachapelle, Calgary, CA;

Ali Broumandan, Calgary, CA;

Inventors:

John Nielsen, Calgary, CA;

Gerard Lachapelle, Calgary, CA;

Ali Broumandan, Calgary, CA;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H04B 17/00 (2006.01);
U.S. Cl.
CPC ...
Abstract

A system for estimating parameters of an incoming signal is provided. At least one antenna is coupled to at least one suitable receiver. The antenna(s) are spatially translated in an arbitrary trajectory. As the antenna(s) is being spatially translated, a data processing means samples the incoming signal at set intervals based on a clock signal provided by a system clock. By sampling the incoming signal at different times at different spatial locations on the arbitrary trajectory, the system acts as a synthetic antenna array. The different samplings of the incoming signal at different times and positions provide signal diversity gain as well as different readings which can be used to estimate and/or calculate various parameters of the incoming signal. The different samplings can be used to detect the incoming signal, estimate its angle of arrival, estimate its time of arrival, as well as other parameters.


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