The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Patent No.:

US 8340582 B1

PDF
Full Text
Expired
Date of Patent:
Dec. 25, 2012

Filed:

Mar. 08, 2011
Applicants:

Kyle E. Kowalske, Columbia, MD (US);

Charles S. Bendall, El Cajon, CA (US);

Inventors:

Kyle E. Kowalske, Columbia, MD (US);

Charles S. Bendall, El Cajon, CA (US);

Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
H04B 17/00 (2006.01);
U.S. Cl.
CPC ...
Abstract

A method of distinguishing center-frequency-tuned signals from off-tuned signals and noise in a single-channel receiver, comprising: receiving a signal with the single-channel receiver; storing the signal in a memory store; calculating the variance of a time-windowed segment of the signal; storing data representing the variance of the segment in the memory store; calculating the kurtosis of the segment of the signal; storing data representing the kurtosis of the segment in the memory store; comparing the variance data and the kurtosis data to variance and kurtosis thresholds respectively; identifying the segment as center-frequency-tuned if the variance of the segment exceeds the variance threshold and the kurtosis falls below the kurtosis threshold; and identifying the segment as non-center-frequency-tuned if the variance of the segment is less than or equal to the variance threshold and/or the kurtosis is greater than or equal to the kurtosis threshold.


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Kowalske, Kyle. (2012). Method for detecting center-frequency-tuned signals in the presence of off-tuned signals and noise using higher order statistics (U.S. Patent No. 8340582). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/8340582

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