The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 25, 2012
Filed:
Oct. 14, 2008
Simon Chen, San Jose, CA (US);
Jen-chan Chien, Saratoga, CA (US);
Hailin Jin, San Jose, CA (US);
Adobe Systems Incorporated, San Jose, CA (US);
Abstract
Methods and apparatus for constraining solution space in image processing techniques may use the metadata for a set of images to constrain an image processing solution to a smaller solution space. In one embodiment, a process may require N parameters for processing an image. A determination may be made from metadata that multiple images were captured with the same camera/lens and with the same settings. A set of values may be estimated for the N parameters from data in one or more of the images. The process may then be applied to each of images using the set of values. In one embodiment, a value for a parameter of a process may be estimated for an image. If the estimated value deviates substantially from a value for the parameter in the metadata, the metadata value is used in the process instead of the estimated value.