The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 25, 2012
Filed:
Jun. 15, 2007
Garbis Salgian, West Windsor, NJ (US);
Supun Samarasekera, Montgomery, NJ (US);
Jiangjian Xiao, Plainsboro, NJ (US);
James Russell Bergen, Hopewell, NJ (US);
Rakesh Kumar, West Windsor, NJ (US);
Feng Han, Lawrenceville, NJ (US);
Garbis Salgian, West Windsor, NJ (US);
Supun Samarasekera, Montgomery, NJ (US);
Jiangjian Xiao, Plainsboro, NJ (US);
James Russell Bergen, Hopewell, NJ (US);
Rakesh Kumar, West Windsor, NJ (US);
Feng Han, Lawrenceville, NJ (US);
SRI International, Menlo Park, CA (US);
Abstract
A method for detecting a moving target is disclosed that receives a plurality of images from at least one camera; receives a measurement of scale from one of a measurement device and a second camera; calculates the pose of the at least one camera over time based on the plurality of images and the measurement of scale; selects a reference image and an inspection image from the plurality of images of the at least one camera; and detects a moving target from the reference image and the inspection image based on the orientation of corresponding portions in the reference image and the inspection image relative to a location of an epipolar direction common to the reference image and the inspection image; and displays any detected moving target on a display. The measurement of scale can derived from a second camera or, for example, a wheel odometer. The method can also detect moving targets by combining the above epipolar method with a method based on changes in depth between the inspection image and the reference image and based on changes in flow between the inspection image and the reference image.