The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 25, 2012
Filed:
Aug. 20, 2009
Shen Feng, San Diego, CA (US);
Gang HU, Shanghai, CN;
Yuanfei Nie, Shanghai, CN;
Meiwu Wu, Shanghai, CN;
Yu Chen, Shanghai, CN;
Xiaomin SI, San Jose, CA (US);
Yiu Leechung, Fremont, CA (US);
Shen Feng, San Diego, CA (US);
Gang Hu, Shanghai, CN;
Yuanfei Nie, Shanghai, CN;
Meiwu Wu, Shanghai, CN;
Yu Chen, Shanghai, CN;
Xiaomin Si, San Jose, CA (US);
Yiu Leechung, Fremont, CA (US);
Montage Technology (Shanghai) Co., Ltd., Shanghai, CN;
Abstract
A method and apparatus for measuring parameters of a receiver having a mixer for generating an I signal and a Q signal using an input signal, an I channel circuit for processing the I signal, and a Q channel circuit for processing the Q signal. The method includes feeding the receiver a first testing signal before the mixer. The method includes feeding the receiver a second testing signal on the I channel circuit. The method includes feeding the receiver a third testing signal on the Q channel circuit. The method includes measuring I/Q quadrature deviation and I/Q delay imbalance of the receiver using the first, the second, and the third testing signals. This separates the I/Q quadrature deviation and I/Q delay imbalance.