The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 25, 2012

Filed:

May. 04, 2010
Applicants:

Shay H. Akirav, Petach-Tikva, IL;

Yariv Bachar, Ma'abarot, IL;

Asaf Levy, Rishon Le Zion, IL;

Ehud Meiri, Tel Aviv, IL;

Inventors:

Shay H. Akirav, Petach-Tikva, IL;

Yariv Bachar, Ma'abarot, IL;

Asaf Levy, Rishon Le Zion, IL;

Ehud Meiri, Tel Aviv, IL;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H04L 12/56 (2006.01);
U.S. Cl.
CPC ...
Abstract

Various embodiments for deduplicated data processing congestion control in a computing environment are provided. In one such embodiment, a single congestion metric is determined from a sampling of a plurality of combined deduplicated data processing congestion statistics in a number of active deduplicated data processes. The congestion limit is calculated from a comparison of the single congestion metric to a congestion target setpoint, the congestion target setpoint being a virtual dimension setpoint and the congestion limit being a manipulated variable. The number of active deduplicated data processes is compared to the congestion limit. If the number of active deduplicated data processes is less than the congestion limit, a new deduplicated data process is spawned.


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