The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 25, 2012
Filed:
Sep. 18, 2008
Oliver Reich, Potsdam, DE;
Hans-gerd Löhmannsröben, Postdam-Golm, DE;
Oliver Reich, Potsdam, DE;
Hans-Gerd Löhmannsröben, Postdam-Golm, DE;
Universitaet Potsdam, , DE;
Abstract
The invention relates to a measuring arrangement for an optical spectrometer, in particular a photon density wave spectrometer, having a measuring chamber, which can be loaded with a sample to be measured, and a coupling-in/coupling-out device which is configured to receive excitation light from a light source and couple it into the sample to be measured in the measuring chamber and to receive measuring light formed in the sample to be measured on account of the excitation light which has been coupled in and to emit said measuring light to a detection device, wherein the coupling-in/coupling-out device has an optical switching device and a plurality of light guide elements which couple to the latter, have a respective optical waveguide and can be connected according to at least one selectable measuring configuration using the optical switching device in order to couple in the excitation light and receive the measuring light according to the at least one selectable measuring configuration, and wherein outputs of the plurality of light guide elements are positioned according to a spiral arrangement in the viewing direction of the outputs.