The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 25, 2012
Filed:
Jan. 21, 2011
Applicant:
Takahumi Oowada, Kariya, JP;
Inventor:
Takahumi Oowada, Kariya, JP;
Assignee:
Denso Corporation, Kariya, JP;
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01R 31/02 (2006.01);
U.S. Cl.
CPC ...
Abstract
In an abnormality diagnosing system for first and second current sensors for measuring a current, an obtaining unit obtains at least one pair of measured values of the first and second current sensors. The at least one pair of measured values is measured by the first and second current sensors at a substantially same timing. A diagnosing unit diagnoses whether there is an abnormality in at least one of the first and second current sensors based on a function defining a relationship between the at least one pair of measured values of the first and second current sensors.