The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 25, 2012

Filed:

Dec. 02, 2009
Applicants:

Florent Miller, Levallois, FR;

Cécile Weulersse, Versailles, FR;

Antonin Bougerol, Suresnes, FR;

Thierry Carriere, Triel sur Seine, FR;

Patrick Heins, Castelnau de Montmiral, FR;

Samuel Hazo, Toulouse, FR;

Inventors:

Florent Miller, Levallois, FR;

Cécile Weulersse, Versailles, FR;

Antonin Bougerol, Suresnes, FR;

Thierry Carriere, Triel sur Seine, FR;

Patrick Heins, Castelnau de Montmiral, FR;

Samuel Hazo, Toulouse, FR;

Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
G01N 23/02 (2006.01); H01J 37/317 (2006.01); H01L 21/265 (2006.01);
U.S. Cl.
CPC ...
Abstract

The invention relates to a device for testing an integrated circuit. The device comprises a plate for receiving and subjecting the integrated circuit to a test. The plate comprises a component for powering and operating the integrated circuit and another component for measuring the operation of the integrated circuit during the test. The device also comprises an irradiation device for subjecting the circuit to a proton bombardment and a mask with a variable thickness provided between a bombardment access region on the integrated circuit and an established zone of the integrated circuit.


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