The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 25, 2012
Filed:
Jun. 09, 2008
Applicants:
Donald E. Waagen, Tucson, AZ (US);
Estille Whittenberger, Tucson, AZ (US);
John S. Costello, Seattle, WA (US);
Inventors:
Donald E. Waagen, Tucson, AZ (US);
Estille Whittenberger, Tucson, AZ (US);
John S. Costello, Seattle, WA (US);
Assignee:
Raytheon Company, Waltham, MA (US);
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
A61B 6/00 (2006.01); G06K 9/68 (2006.01);
U.S. Cl.
CPC ...
Abstract
Methods and apparatus for detecting anomalies in images according to various aspects of the present invention operate in conjunction with an optical flow system. The optical flow system may receive image data for a first image and a second image and generate flow vectors corresponding to differences between the first image and the second image. An analyzer may be coupled to the optical flow system and analyze the flow vectors to identify anomalies in the second image.