The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 25, 2012

Filed:

Dec. 01, 2010
Applicants:

Georg Kormann, Zweibrücken, DE;

James J. Phelan, Bettendorf, IA (US);

Andrzej Kozicki, Milan, IL (US);

Thomas Herlitzius, Coswig, DE;

Jens Teichmann, Panschwitz-Kuckau, DE;

Andi Günther, Dresden, DE;

Inventors:

Georg Kormann, Zweibrücken, DE;

James J. Phelan, Bettendorf, IA (US);

Andrzej Kozicki, Milan, IL (US);

Thomas Herlitzius, Coswig, DE;

Jens Teichmann, Panschwitz-Kuckau, DE;

Andi Günther, Dresden, DE;

Assignee:

Deere & Company, Moline, IL (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
A01D 75/18 (2006.01);
U.S. Cl.
CPC ...
Abstract

A system for presenting a crop sample to a crop property sensor is in particular suited for a harvesting machine and comprises a bypass line branching off from a crop feeding assembly, a conveyor for feeding the branched-off crop through the bypass line without damaging the crop, and a crop property sensor for sensing one or more properties of the crop in the bypass line. The bypass line is upwardly angled or extends vertical, such that the conveyor elevates the material from the crop guiding channel to the crop property sensor.


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