The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 25, 2012
Filed:
Jun. 18, 2008
Jean-louis Grzesiak, Bristol, GB;
James Arash Shabani, Bristol, GB;
Jean-Louis Grzesiak, Bristol, GB;
James Arash Shabani, Bristol, GB;
Renishaw PLC, Wotton-Under-Edge, GB;
Abstract
A method of calibrating a measurement scale in a motorized scanning head using a reference artefact is described. The method comprises the step of rotating a surface sensing device, such as a scanning probe, mounted on the scanning head about at least one axis of the scanning head to move the surface sensing device into a plurality of different angular orientations relative to the reference artefact. A step is then performed of measuring, with the surface sensing device, at least one property of the reference artefact at each of the different angular orientations. An error map or function is then created for at least one measurement scale of the scanning head using the properties of the reference artefact measured and optionally known or calibrated properties of that reference artefact. The method may comprise use of co-ordinate positioning apparatus, such as a co-ordinate measuring machine, to move the scanning head. The reference artefact may comprise a single feature or an array of features.