The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 18, 2012

Filed:

Mar. 21, 2011
Applicants:

David G. Taggart, North Kingstown, RI (US);

Peter Dewhurst, West Kingston, RI (US);

Arun U. Nair, Raleigh, NC (US);

Inventors:

David G. Taggart, North Kingstown, RI (US);

Peter Dewhurst, West Kingston, RI (US);

Arun U. Nair, Raleigh, NC (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 17/50 (2006.01); G06F 17/10 (2006.01);
U.S. Cl.
CPC ...
Abstract

A method is disclosed of providing an optimal minimum mass topology for a structure based on a set of design criteria including at least one support point and at least one force to be applied to the structure. The method includes the steps of: identifying a plurality of nodes within a structure design domain, and assigning an initial density value to said plurality of nodes; conducting a finite element analysis on the nodes; determining one of a stress intensity or strain energy values for each node; ranking the nodes by relative stress intensity or strain energy values; adjusting the density value for each node; and repeating the steps of conducting a finite element analysis on said nodes, wherein the step of adjusting each density value for each node is performed according to a family of statistical distribution functions that gradually transition to a bimodal distribution wherein nodes are either fully dense or effectively void thereby providing an optimal topology.


Find Patent Forward Citations

Loading…