The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 18, 2012

Filed:

Mar. 17, 2008
Applicants:

Payam Saisan, Santa Monica, CA (US);

Shubha L. Kadambe, Thousand Oaks, CA (US);

Inventors:

Payam Saisan, Santa Monica, CA (US);

Shubha L. Kadambe, Thousand Oaks, CA (US);

Assignee:

Raytheon Company, Waltham, MA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06K 9/00 (2006.01);
U.S. Cl.
CPC ...
Abstract

In one aspect, a method to identify a candidate object includes receiving an image of the candidate object and projecting the received image onto an image subspace. The image subspace is formed from images of known objects of a class. The method also includes determining whether the candidate object is in the object class based on the received image and the image subspace using a likelihood ratio. The likelihood ratio includes a first probability density indicating a probability an object is in the object class and a second probability density indicating a probability an object is not in the class. The first probability density and the second probability are each a function of a distance of the received image to the image subspace.


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