The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 18, 2012
Filed:
Sep. 05, 2008
Robert William Rudeen, Eugene, OR (US);
Wenliang Gao, Eugene, OR (US);
Bryan L. Olmstead, Eugene, OR (US);
Robert William Rudeen, Eugene, OR (US);
WenLiang Gao, Eugene, OR (US);
Bryan L. Olmstead, Eugene, OR (US);
Datalogic ADC, Inc., Eugene, OR (US);
Abstract
Disclosed are embodiments of methods, systems, and apparatus for providing virtual scan lines in an imaging system that compensate for the optical distortion associated with the system. In some embodiments, the virtual scan lines may be curved or angled according to their position in the Field of View (FOV) of the imaging system to compensate for the distortion. Some embodiments may provide for virtual scan lines that are preconfigured to compensate for a typical or pre-selected level and type of optical distortion. Other embodiments may be configured to measure or otherwise ascertain the actual distortion of the optical lens and/or other components of the system and generate a virtual scan line pattern that compensates for the measured distortion.