The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 18, 2012
Filed:
Mar. 25, 2010
Jess R. Gentner, Rochester, NY (US);
Martin J. Pepe, West Henrietta, NY (US);
Timothy J. Clark, Marion, NY (US);
Jess R. Gentner, Rochester, NY (US);
Martin J. Pepe, West Henrietta, NY (US);
Timothy J. Clark, Marion, NY (US);
Xerox Corporation, Norwalk, CT (US);
Abstract
An apparatus () and method () that determines beam delays in a printing device is disclosed. The apparatus can include a photosensitive surface () and a raster output scanner () optically coupled to the photosensitive surface, an integrated scan detector () configured to detect the beams from the raster output scanner and configured to produce a signal based on the beams detected from the raster output scanner, and a beam calibration controller () coupled to the integrated scan detector. The beam calibration controller can be configured to determine at least one beam delay between the first optical emitter and the at least one second optical emitter based on signals from the integrated scan detector and can also be configured to delay operation between the first optical emitter and the at least one second optical emitter based on the at least one beam delay.