The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 18, 2012

Filed:

Jun. 10, 2011
Applicants:

Harish S. Muthali, San Jose, CA (US);

Xiaojun Zhu, Saratoga, CA (US);

Inventors:

Harish S. Muthali, San Jose, CA (US);

Xiaojun Zhu, Saratoga, CA (US);

Assignee:

Ambarella, Inc., Santa Clara, CA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H03K 5/12 (2006.01);
U.S. Cl.
CPC ...
Abstract

An apparatus comprising a first circuit, a state machine, a compare circuit and a calibration circuit. The first circuit may be configured to generate a slew rate control signal and a calibration signal in response to (i) a plurality of control bits and (ii) an operation signal. The state machine may be configured to generate the operation signal and a plurality of intermediate control signals in response to (i) a compare signal and (ii) clock signal. The compare circuit may be configured to generate the compare signal in response to (i) a reference voltage and (ii) a capacitance signal. The calibration circuit may be configured to generate the capacitance signal in response to (i) the calibration signal and (ii) the plurality of intermediate control signals.


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