The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 18, 2012

Filed:

Feb. 11, 2010
Applicants:

Kyu-sang Lee, Ulsan, KR;

Seong-ho Cho, Gwacheon-si, KR;

Carl S. Brown, Seattle, WA (US);

Kyla Teplitz, Seattle, WA (US);

Inventors:

Kyu-sang Lee, Ulsan, KR;

Seong-ho Cho, Gwacheon-si, KR;

Carl S. Brown, Seattle, WA (US);

Kyla Teplitz, Seattle, WA (US);

Assignees:

Samsung Electronics Co., Ltd., Samsung-ro, Yeongtong-gu, Suwon-si, Gyeonggi-do, KR;

Applied Precision, Inc., Issaquah, WA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N 33/48 (2006.01);
U.S. Cl.
CPC ...
Abstract

A substrate includes; a fiducial mark disposed on the substrate, an area on the substrate on which a probe material is configured to be immobilized, the area being separated from the fiducial mark, and a probe immobilization compound disposed on the area on the substrate on which the probe material is configured to be immobilized, wherein the fiducial mark has a structure which reflects irradiated light at a greater intensity than an intensity of reflected irradiated light form the area on the substrate not corresponding to the fiducial mark.


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