The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Patent No.:

US 8333876 B1

PDF
Full Text
Expired
Date of Patent:
Dec. 18, 2012

Filed:

Dec. 04, 2009
Applicants:

Jung-chuan Chou, Yunlin County, TW;

Chang-chi Lee, Yunlin County, TW;

Inventors:

Jung-Chuan Chou, Yunlin County, TW;

Chang-Chi Lee, Yunlin County, TW;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N 27/26 (2006.01);
U.S. Cl.
CPC ...
Abstract

An ion concentration measurement system is provided. The ion concentration measurement system has: at least an end system having a sensing unit for measuring the ion concentration of a test solution to generate at least a sensing signal; a control unit for controlling the acquisition of the sensing signal; a display unit for displaying the sensing signal in real time; and an end wireless transmission interface for transmitting the sensing signal wirelessly.


Find Patent Forward Citations

Chou, Jung-Chuan. (2012). Ion concentration measurement system and methods thereof (U.S. Patent No. 8333876). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/8333876

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Loading…