The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 18, 2012
Filed:
Mar. 18, 2011
Applicant:
Osamu Wada, Ina, JP;
Inventor:
Osamu Wada, Ina, JP;
Assignee:
Seiko Epson Corporation, Tokyo, JP;
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
A61B 3/10 (2006.01); A61B 3/04 (2006.01);
U.S. Cl.
CPC ...
Abstract
A wearing condition parameter measurement device for a spectacle lens adapted to measure a wearing condition parameter necessary for manufacturing spectacles includes a mirror having a mirror surface adapted to reflect the wearing condition of a wearer of the spectacle lens, an imaging camera adapted to simultaneously shoot the wearer and the mirror surface reflecting the wearer to obtain a shot image, and a calculation device adapted to calculate the wearing condition parameter based on the shot image obtained by the imaging camera.