The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 18, 2012

Filed:

Jan. 13, 2010
Applicants:

Yasunobu Takagi, Kanagawa, JP;

Takashi Kimura, Kanagawa, JP;

Taku Satoh, Kanagawa, JP;

Masakazu Yoshida, Kanagawa, JP;

Toshihito Kamei, Tokyo, JP;

Inventors:

Yasunobu Takagi, Kanagawa, JP;

Takashi Kimura, Kanagawa, JP;

Taku Satoh, Kanagawa, JP;

Masakazu Yoshida, Kanagawa, JP;

Toshihito Kamei, Tokyo, JP;

Assignee:

Ricoh Company, Ltd., Tokyo, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
B41J 29/38 (2006.01);
U.S. Cl.
CPC ...
Abstract

An image forming apparatus performs a 1-pass recording by a single main scan with respect to a recording medium by a nozzle group including different overlapping nozzles that scan the same overlapping region on the recording medium to record dots. Alternatively, a multi-pass recording is performed by a plurality of main scans with respect to the overlapping region by the same nozzle group or by different nozzle groups. The recording in a central portion of the overlapping region is performed by placing emphasis on the succession or continuity of the dots, while the recording in boundary portions of the overlapping region is performed by placing emphasis on the scattering of the dots.


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