The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 18, 2012

Filed:

Oct. 27, 2009
Applicants:

Hiroo Tatsutani, Kobe, JP;

Hiroyuki Tanaka, Halstenbek, DE;

Inventors:

Hiroo Tatsutani, Kobe, JP;

Hiroyuki Tanaka, Halstenbek, DE;

Assignee:

Sysmex Corporation, Hyogo, JP;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01N 35/02 (2006.01);
U.S. Cl.
CPC ...
Abstract

A sample processing apparatus comprising: a plurality of measuring units, each of which measures a sample; a sample conveyance unit for conveying a sample to at least one of the plurality of measurement units; a display unit; and a display controller for controlling the display unit to display an analysis result of a sample which the analysis result has been obtained based on the measurement by at least one of the plurality of measurement units, and controlling the display unit to display conveyance status information indicating a conveyance status of the sample which analysis result has not been obtained yet based on the measurement by at least one of the plurality of measurement units, is disclosed. A sample information display apparatus is also disclosed.


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