The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 18, 2012

Filed:

Aug. 18, 2010
Applicant:

Mika Hietala, Espoo, FI;

Inventor:

Mika Hietala, Espoo, FI;

Assignee:

General Electric Company, Schenectady, NY (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01F 17/00 (2006.01); G01N 33/497 (2006.01); A61B 5/08 (2006.01);
U.S. Cl.
CPC ...
Abstract

A method for determining a sample flow volume is disclosed herein. The method includes withdrawing the sample flow at a first and second flow rate from a gas flow, measuring a concentration of at least one gas component and measuring at least one of an airway pressure and flow. The method also includes generating first measurement results based on the concentration, generating second measurement results based on the at least one of the airway pressure and flow and setting a suitable point of comparison. The method further includes determining a first and second time delay between the point of comparison of the first and second measurement results of the first and second flow rate, providing information about the first and second sample flow rate and determining the sample volume based on differences between the first and second time delay. A corresponding arrangement is also provided.


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