The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Patent No.:

US 8332959 B1

PDF
Full Text
Expired
Date of Patent:
Dec. 11, 2012

Filed:

Jun. 04, 2008
Applicants:

Weifeng Chen, Amherst, MA (US);

Zhen Liu, Tarrytown, NY (US);

Anton Riabov, Ossining, NY (US);

Angela Marie Schuett, Columbia, MD (US);

Inventors:

Weifeng Chen, Amherst, MA (US);

Zhen Liu, Tarrytown, NY (US);

Anton Riabov, Ossining, NY (US);

Angela Marie Schuett, Columbia, MD (US);

Attorneys:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06F 21/00 (2006.01); G06N 5/02 (2006.01);
U.S. Cl.
CPC ...
Abstract

A risk assessment system and method includes an information system configured to disclose information to a third party. A risk determination model is configured to compute identifiability risk for on one or more records in storage. The identifiability risk is compared to a threshold prior to being disclosed wherein the information system is informed of the identifiability risk exceeding the threshold prior to disclosure to the third party.


Find Patent Forward Citations

Chen, Weifeng. (2012). System and method for privacy protection using identifiability risk assessment (U.S. Patent No. 8332959). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/8332959

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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