The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 11, 2012

Filed:

Jun. 10, 2008
Applicants:

Constantin M. Adam, New York, NY (US);

Michael Joseph Spreitzer, Croton-on-Hudson, NY (US);

Malgorzata Steinder, Leonia, NJ (US);

Chunqiang Tang, Ossining, NY (US);

Inventors:

Constantin M. Adam, New York, NY (US);

Michael Joseph Spreitzer, Croton-on-Hudson, NY (US);

Malgorzata Steinder, Leonia, NJ (US);

Chunqiang Tang, Ossining, NY (US);

Attorneys:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06F 3/00 (2006.01); G06F 9/44 (2006.01); G06F 9/46 (2006.01); G06F 13/00 (2006.01);
U.S. Cl.
CPC ...
Abstract

A method for determining an application instance placement in a set of machines under one or more resource constraints includes the following steps. An estimate is computed of a value of the first metric that can be achieved by a current application instance placement and a current application load distribution. A new application instance placement and a new application load distribution are determined, wherein the new application instance placement and the new load distribution optimize the first metric.


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