The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 11, 2012
Filed:
Aug. 10, 2007
Ronald D. Finlayson, Blythewood, SC (US);
Naomi M. Mitsumori, San Jose, CA (US);
Francis X. Reddington, Sarasota, FL (US);
Ronald D. Finlayson, Blythewood, SC (US);
Naomi M. Mitsumori, San Jose, CA (US);
Francis X. Reddington, Sarasota, FL (US);
International Business Machines Corporation, Armonk, NY (US);
Abstract
Within the context of a software factory, process sensors detect time consuming activities that extend beyond an estimated predetermined completion timeline for a project. These process sensors also detect wait states that are caused by processes and activities of tasks that are not critical to completing the project. A process analysis is used to determine if defined added value processes and activities identified in a value stream analysis are interdependent to a critical path for executing the project. If the defined added value processes and activities identified in the value stream analysis are determined to not be interdependent to the critical path for executing the project, then a determination is made that performance of the defined added value processes and activities identified in the value stream analysis is wasteful and such processes and activities are eliminated from the process.