The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 11, 2012

Filed:

Oct. 10, 2008
Applicants:

Sun-kwon Kim, Suwon-si, KR;

Byeong-hoon Lee, Seoul, KR;

Ki-hong Kim, Suwon-si, KR;

Hyuck-jun Cho, Yongin-si, KR;

Inventors:

Sun-Kwon Kim, Suwon-si, KR;

Byeong-Hoon Lee, Seoul, KR;

Ki-Hong Kim, Suwon-si, KR;

Hyuck-Jun Cho, Yongin-si, KR;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 21/00 (2006.01);
U.S. Cl.
CPC ...
Abstract

A semiconductor integrated circuit including a detector and a secure checker. The detector generates a detection signal upon sensing an abnormal state in an operating environment of the semiconductor integrated circuit. The secure checker generates a check signal to find an operating condition of the detector and receives the detection signal. The detector activates the detection signal in response to the check signal.


Find Patent Forward Citations

Kim, Sun-Kwon. (2012). Semiconductor integrated circuit and testing method thereof (U.S. Patent No. 8332662). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/8332662

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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