The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 11, 2012
Filed:
Jan. 30, 2009
Lawrence L. Case, Austin, TX (US);
Asaf Ashkenazi, Austin, TX (US);
Ruchir Chhabra, Austin, TX (US);
Carlin R. Covey, Tempe, AZ (US);
David H. Hartley, Seacombe Heights, AU;
Troy E. Mackie, Austin, TX (US);
Alistair N. Muir, Austin, TX (US);
Mark D. Redman, Gilbert, AZ (US);
Thomas E. Tkacik, Phoenix, AZ (US);
John J. Vaglica, Austin, TX (US);
Rodney D. Ziolkowski, Austin, TX (US);
Lawrence L. Case, Austin, TX (US);
Asaf Ashkenazi, Austin, TX (US);
Ruchir Chhabra, Austin, TX (US);
Carlin R. Covey, Tempe, AZ (US);
David H. Hartley, Seacombe Heights, AU;
Troy E. Mackie, Austin, TX (US);
Alistair N. Muir, Austin, TX (US);
Mark D. Redman, Gilbert, AZ (US);
Thomas E. Tkacik, Phoenix, AZ (US);
John J. Vaglica, Austin, TX (US);
Rodney D. Ziolkowski, Austin, TX (US);
Freescale Semiconductor, Inc., Austin, TX (US);
Abstract
Under the direction of a first party, an integrated circuit (IC) device is configured to temporarily enable access to a debug interface of the IC device via authentication of the first party by a challenge/response process using a key of the IC device and a challenge value generated at the IC device. The first party then may conduct a software evaluation of the IC device via the debug interface. In response to failing to identify an issue with the IC device from the software evaluation, the first party can permanently enable open access to the debug interface while authenticated and provide the IC device to a second party. Under the direction of the second party, a hardware evaluation of the IC device is conducted via the debug interface that was permanently opened by the first party.