The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 11, 2012
Filed:
Mar. 14, 2007
Assaf Schuster, Haifa, IL;
Daniel Keren, Tivon, IL;
Izchak Sharfman, Tel-Aviv, IL;
Technion Research & Development Foundation Ltd., Haifa, IL;
Abstract
A method for distributed computing includes processing multiple sets of data at respective computing nodes (), and calculating respective local values of one or more statistical parameters characterizing the sets of the data. A global condition is defined, such that the condition is violated when a function defined over a weighted average of the respective local values crosses a predetermined threshold. The global condition is separated into a plurality of local constraints, which include a respective local constraint to be evaluated by each of the nodes based on the respective local values, such that violation of the respective local constraint in at least one of the nodes indicates a violation of the global condition. The local constraint is evaluated independently at each of the nodes. When at least one of the nodes detects that the respective local constraint is violated, an indication that the global condition has been violated is produced.