The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 11, 2012

Filed:

Mar. 04, 2008
Applicant:

Kiyoshi Kato, Tokyo, JP;

Inventor:

Kiyoshi Kato, Tokyo, JP;

Assignee:

NEC Corporation, Tokyo, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 17/00 (2006.01);
U.S. Cl.
CPC ...
Abstract

An operation management apparatus decides that newly-generated event data and previously-existing predictive event data match if the attribute values of the event data match the attribute values of the predictive event data excluding reference values. In such a case, the apparatus identifies individual filter information whose attribute values excluding reference values match the attribute values of the event data, and substitutes the attribute values of the event data for variables in each piece of individual filter information belonging to a group to which the individual filter information belongs, thereby generating predictive event data for each piece of individual filter information. The apparatus decides whether or not each piece of event data that is associated in a predictive event index with the group to which the individual filter information that matches the event data used for generating the predictive event data belongs satisfies the individual filter information of operation rule information corresponding to the group, and if satisfies, performs processing defined by the operation rule information.


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