The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 11, 2012
Filed:
Apr. 01, 2008
Christopher W. Claus, San Antonio, TX (US);
Lisa Cobb Alexander, Boerne, TX (US);
Paul Fulmer, Boerne, TX (US);
Laif Wheeler, Helotes, TX (US);
Ivan Quan, San Antonio, TX (US);
Jayson Sacco, San Antonio, TX (US);
Andrew S. Dempsey, San Antonio, TX (US);
Nancy Jane Shutt, Bulverde, TX (US);
Christopher W. Claus, San Antonio, TX (US);
Lisa Cobb Alexander, Boerne, TX (US);
Paul Fulmer, Boerne, TX (US);
Laif Wheeler, Helotes, TX (US);
Ivan Quan, San Antonio, TX (US);
Jayson Sacco, San Antonio, TX (US);
Andrew S. Dempsey, San Antonio, TX (US);
Nancy Jane Shutt, Bulverde, TX (US);
United Services Automobile Association (USAA), San Antonio, TX (US);
Abstract
Retirement planning for a person is performed. For each of each class of assets, the income, and the expenses of the person, an analysis is employed that produces a probabilistic distribution of possible future values therefor, and based on each produced distribution derives a respective best case future value, a worst case future value, and a median case future value. Each analysis is conducted by compiling a collection of historical values, performing multiple scenarios based on random inputs to calculate expected future values for each of several particular future periods of time, deriving a probabilistic distribution with distribution values relating to projected future value for each period of time, and deriving a best case future value, a worst case future value, and a median case future value from each probabilistic distribution.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile