The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 11, 2012
Filed:
Mar. 05, 2010
Kuo-lun Tung, Taoyuan County, TW;
Yu-ling LI, Taoyuan County, TW;
Nien-jung Lin, Taoyuan County, TW;
Shih-chieh Lai, Taoyuan County, TW;
Yi-hsun Huang, Taoyuan County, TW;
Kuo-Lun Tung, Taoyuan County, TW;
Yu-Ling Li, Taoyuan County, TW;
Nien-Jung Lin, Taoyuan County, TW;
Shih-Chieh Lai, Taoyuan County, TW;
Yi-Hsun Huang, Taoyuan County, TW;
Chung Yuan Christian University, Tao-Yuan, TW;
Abstract
The present invention discloses a detection and analysis apparatus, comprising a photo sensing device, comprising a plurality of sensing elements linearly arranged to form a first array, for detecting a signal of the thickness change of the cake at a linear position of the filter medium; a driving device, for driving the photo sensing device to move relatively parallel to the filter medium on the top of the cake so that the photo sensing device detects the thickness change of the cake on at least one local plane of the filter medium; and a data processing device, coupling to the photo sensing device, for continuously processing and analyzing the signal detected by the photo sensing device to thereby in-situ estimate the thickness change of the cake on the at least one local plane of the filter medium during the filtration process.