The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 11, 2012
Filed:
Jun. 21, 2010
Beatriz Cristina Custode, Webster, NY (US);
Stuart Alan Schweid, Pittsford, NY (US);
James Edward Baxter, Iii, Canandaigua, NY (US);
Beatriz Cristina Custode, Webster, NY (US);
Stuart Alan Schweid, Pittsford, NY (US);
James Edward Baxter, III, Canandaigua, NY (US);
Xerox Corporation, Norwalk, CT (US);
Abstract
What is disclosed is a novel system and method for detecting and correcting for In-Line-Spectrophotometer (ILS) measurements of constant value patches in the presence of banding in multi-function document reproduction systems. The present system analyzes the ILS data stream to identify structured noise components due to banding. An FFT is performed on each L*a*b* component in the ILS stream for a single test page. The peak frequencies from the FFT of the L* a* and b* channels are compared. Common frequencies in all 3 channels indicate a banding component. Once the banding frequencies and the banding wavelength are known, the color patch target can be adjusted to ensure the color patches are synchronized to the banding wavelength. By running a series of synchronized patches and averaging results, structured noise can be eliminated. In such a manner, a reduction of banding effects on color calibration can be effectuated.