The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 11, 2012

Filed:

Aug. 28, 2009
Applicant:

Bruce H. Dean, New Market, MD (US);

Inventor:

Bruce H. Dean, New Market, MD (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06K 9/36 (2006.01); G06K 9/32 (2006.01); G06K 9/00 (2006.01);
U.S. Cl.
CPC ...
Abstract

According to various embodiments, a method is provided for improving data and a system is provided that is configured to perform the method. The method can comprise processing a data signal by using an optical system comprising a signal processor. The method can comprise collecting data generated by the optical system, wherein the data comprises non-uniformly sampled data. The method can comprise performing an interpolation operation on the non-uniformly sampled data using the signal processor, to generate interpolated data. Further, the method can comprise adjusting the data with the interpolated data using the signal processor, to generate improved data. The improved data can be output to a user, for example, by displaying the improved data on a display unit, or by printing out the improved data. According to various embodiments, the data can comprise any desired data, for example, image data. The method can comprise improving the image resolution, improving the image brightness, improving the image contrast, and/or improving the image focus.


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