The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 11, 2012
Filed:
Sep. 22, 2010
Maneesh Dewan, West Chester, PA (US);
Gerardo Hermosillo Valadez, West Chester, PA (US);
Zhao Yi, Los Angeles, CA (US);
Yiqiang Zhan, Berwyn, PA (US);
Maneesh Dewan, West Chester, PA (US);
Gerardo Hermosillo Valadez, West Chester, PA (US);
Zhao Yi, Los Angeles, CA (US);
Yiqiang Zhan, Berwyn, PA (US);
Siemens Medical Solutions USA, Inc., Malvern, PA (US);
Abstract
Described herein is a framework for constructing a hierarchical classifier for facilitating classification of digitized data. In one implementation, a divergence measure of a node of the hierarchical classifier is determined. Data at the node is divided into at least two child nodes based on a splitting criterion to form at least a portion of the hierarchical classifier. The splitting criterion is selected based on the divergence measure. If the divergence measure is less than a predetermined threshold value, the splitting criterion comprises a divergence-based splitting criterion which maximizes subsequent divergence after a split. Otherwise, the splitting criterion comprises an information-based splitting criterion which seeks to minimize subsequent misclassification error after the split.