The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 11, 2012
Filed:
Dec. 03, 2009
Won Soo Ji, Gyunggi-do, KR;
Wook Hee Lee, Gyunggi-do, KR;
Ho Young Song, Gyunggi-do, KR;
Chong Wook Cho, Gyunggi-do, KR;
Sung Jae Kim, Gyunggi-do, KR;
Young Su Yun, Gyunggi-do, KR;
Hong Min Kim, Gyunggi-do, KR;
Won Soo Ji, Gyunggi-do, KR;
Wook Hee Lee, Gyunggi-do, KR;
Ho Young Song, Gyunggi-do, KR;
Chong Wook Cho, Gyunggi-do, KR;
Sung Jae Kim, Gyunggi-do, KR;
Young Su Yun, Gyunggi-do, KR;
Hong Min Kim, Gyunggi-do, KR;
Samsung Electronics Co., Ltd., Seoul, KR;
Abstract
There is provided an LED testing apparatus. An LED testing apparatus according to an aspect of the invention may include: a first lighting unit generating first light and irradiating the first light onto an LED having an encapsulant including a fluorescent material excited by the first light to emit light having a longer wavelength than the first light; a second lighting unit generating second light having a longer wavelength than the first light to irradiate the second light onto the LED; an image acquisition unit receiving the light emitted from the fluorescent material and the second light reflected off the LED to acquire images of the LED; and an LED state determination unit determining whether the LED is acceptable or defective using the images of the LED acquired by the image acquisition unit.