The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 11, 2012

Filed:

Dec. 21, 2007
Applicants:

Seyfullah Halit Oguz, San Diego, CA (US);

Sitaraman Ganapathy Subramanian, San Diego, CA (US);

Inventors:

Seyfullah Halit Oguz, San Diego, CA (US);

Sitaraman Ganapathy Subramanian, San Diego, CA (US);

Assignee:

QUALCOMM Incorporated, San Diego, CA (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H04N 7/12 (2006.01);
U.S. Cl.
CPC ...
Abstract

Techniques for efficient determination of a macroblock's spatial predictability quality with respect to the H.264 specification are provided. A device comprises a processor operable to estimate a first subset of spatial prediction modes based on a first pixel subset of a current subblock of an intra-frame. The processor is also operable to estimate a second subset of spatial prediction modes based on a second pixel subset of the current subblock. The first subset of prediction modes is different from the second subset of prediction modes.


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Oguz, Seyfullah. (2012). Systems and methods for efficient spatial intra predictabilty determination (or assessment) (U.S. Patent No. 8331448). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/8331448

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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