The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 11, 2012
Filed:
Apr. 14, 2010
Fook Chiong Cheong, New York, NY (US);
David G. Grier, New York, NY (US);
Sang-hyuk Lee, Albany, CA (US);
Fook Chiong Cheong, New York, NY (US);
David G. Grier, New York, NY (US);
Sang-Hyuk Lee, Albany, CA (US);
New York University, New York, NY (US);
Abstract
A method and system for performing three-dimensional holographic microscopy of an optically trapped one dimensional structure. The method and system use an inverted optical microscope, a laser source which generates a trapping laser beam wherein the laser beam is focused by an objective lens into a plurality of optical traps. The method and system also use a collimated laser at an imaging wavelength to illuminate the structure created by the optical traps. Imaging light scattered by the optically tapped structure forms normalized intensity holograms that are imaged by a video camera and analyzed by optical formalisms to determine light field to reconstruct 3-D images for analysis and evaluation.