The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 11, 2012

Filed:

Mar. 30, 2010
Applicants:

Jun Watanabe, Minami-Ashigara, JP;

Hiroyuki Yoneyama, Minami-Ashigara, JP;

Takato Suzuki, Minami-Ashigara, JP;

Inventors:

Jun Watanabe, Minami-Ashigara, JP;

Hiroyuki Yoneyama, Minami-Ashigara, JP;

Takato Suzuki, Minami-Ashigara, JP;

Assignee:

FUJIFILM Corporation, Minato-Ku, Tokyo, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G02F 1/1335 (2006.01); G02B 5/02 (2006.01); G02B 1/08 (2006.01); G02B 27/00 (2006.01); B05D 5/06 (2006.01); B05D 3/02 (2006.01);
U.S. Cl.
CPC ...
Abstract

In a method for making an antiglare film including the casting, the releasing, the drying, the applying and the curing as defined herein, the transparent particles have an average primary particle size of greater than 2.5 μm and not greater than 12 μm, the transparent base has on at least one side thereof flat portions substantially parallel to a film-forming plane and rounded protrusions arising from the transparent particles, the protrusions having a maximum height Rt from the flat portions of from 1 to 15 μm, and the cured layer has an average thickness of from 1 to 15.0 μm and a surface profile with an arithmetic average roughness Ra, a mean spacing between peaks Sm, and an average slope θa, all as measured in accordance with JIS B0601, satisfying the relationships (1) to (3) as defined herein.


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