The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 11, 2012

Filed:

Apr. 12, 2010
Applicants:

Sang-hack Jung, Princeton, NJ (US);

Ajay Divakaran, Monmouth Junction, NJ (US);

Harpreet Singh Sawhney, West Windsor, NJ (US);

Inventors:

Sang-Hack Jung, Princeton, NJ (US);

Ajay Divakaran, Monmouth Junction, NJ (US);

Harpreet Singh Sawhney, West Windsor, NJ (US);

Assignee:

SRI International, Menlo Park, CA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H04N 7/18 (2006.01);
U.S. Cl.
CPC ...
Abstract

A computer-implemented method for for matching objects is disclosed. At least two images where one of the at least two images has a first target object and a second of the at least two images has a second target object are received. At least one first patch from the first target object and at least one second patch from the second target object are extracted. A distance-based part encoding between each of the at least one first patch and the at least one second patch based upon a corresponding codebook of image parts including at least one of part type and pose is constructed. A viewpoint of one of the at least one first patch is warped to a viewpoint of the at least one second patch. A parts level similarity measure based on the view-invariant distance measure for each of the at least one first patch and the at least one second patch is applied to determine whether the first target object and the second target object are the same or different objects.


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