The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 11, 2012
Filed:
Oct. 23, 2007
Ichiro Kataoka, Hitachinaka, JP;
Ichiro Nishigaki, Ishioka, JP;
Yoshimitsu Hiro, Yokohama, JP;
Masayuki Hariya, Kasumigaura, JP;
Ichiro Kataoka, Hitachinaka, JP;
Ichiro Nishigaki, Ishioka, JP;
Yoshimitsu Hiro, Yokohama, JP;
Masayuki Hariya, Kasumigaura, JP;
Hitachi, Ltd., Tokyo, JP;
Abstract
It is possible to automatically correct a six-plane body mesh pattern so as to satisfy the required quality. A device for generating a mesh pattern for analysis comprises: surface mesh generating device for generating a surface mesh pattern of an analysis object by acquiring shape model data on the analysis object and mesh control data including required quality of an analysis mesh model; internal mesh generating device for generating an internal mesh pattern of the analysis object according to the generated surface mesh pattern; device for calculating the element quality of surface meshes; quality evaluating device for evaluating calculated element quality according to the required quality; and mesh correction device for shifting a surface mesh node point not satisfying the required quality in the direction to improve the quality.