The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 11, 2012
Filed:
Nov. 30, 2007
Soon-soo OH, Daejon, KR;
Yong-hee Cho, Daejon, KR;
Je-hoon Yun, Daejon, KR;
Joung-myoun Kim, Daejon, KR;
Jung-ick Moon, Daejon, KR;
Soon-Soo Oh, Daejon, KR;
Yong-Hee Cho, Daejon, KR;
Je-Hoon Yun, Daejon, KR;
Joung-Myoun Kim, Daejon, KR;
Jung-Ick Moon, Daejon, KR;
Abstract
Provided is a system and method for measuring an antenna radiation pattern in a Fresnel region based on a phi-variation method. The system includes a rotator for changing angles of a reference antenna and a target antenna; a vector network analyzer for obtaining radiation pattern data in accordance with transmission/reception radio frequency (RF) signals between the reference antenna and the target antenna; a measurement unit for calculating a far-field radiation pattern based on the radiation pattern data received from the vector network analyzer; and a controller for controlling the rotator according to a measurement angle transmitted from the measurement unit.