The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 11, 2012
Filed:
Aug. 20, 2010
Israel A. Wagner, Zichron-Yaakov, IL;
Israel A. Wagner, Zichron-Yaakov, IL;
International Business Machines Corporation, Armonk, NY (US);
Abstract
A novel and useful apparatus and related method for on-chip measurement of the clock to output delay of a latch within an integrated circuit. The delay measurement mechanism enables measuring the time delay from the transition of the clock input to the data output of a latch. The output delay of the on-chip latch is measured by making the latch delay part of a ring oscillator and measuring its frequency of oscillation. A latch based delay stage is used to construct the ring oscillator in which a delayed short pulse derived from the input edge is used as the trigger for the latch. The latched ring oscillator mechanism of the invention can be used to measure the clock to output (C2Q) delay of on-chip latch devices.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile