The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 11, 2012
Filed:
Jan. 06, 2010
Rainer Herrmann, Hamburg, DE;
Udo Schlemm, Hamburg, DE;
Stefan Zaage, Hannover, DE;
Harald Ceslik, Hamburg, DE;
Rainer Herrmann, Hamburg, DE;
Udo Schlemm, Hamburg, DE;
Stefan Zaage, Hannover, DE;
Harald Ceslik, Hamburg, DE;
TEWS Elektronik GmbH & Co. KG, Hamburg, DE;
Abstract
Method and apparatus for the measurement of mass or density and/or for the measurement of the humidity in a plurality of portioned units in a non-metallic carrier material, which provides the following: a microwave measuring instrument, consisting of at least one microwave resonator for generating at least one resonance mode in a spatially limited measurement area and an analyzing unit for analyzing at least one variable of the at least one resonance mode, a conveying device for the carrier material, which transports the carrier material with the portioned units through the measurement area, the microwave measuring instrument measures at least one variable of the at least one resonance mode at a time when only the carrier material without portioned unit is in the measurement area, and at a time when the portioned unit is at least partially in the measurement area, the analyzing unit subtracts the variable measured for the carrier material from the measurement values for the portioned unit, and determines a value of the humidity and/or of the mass or density of the portioned unit from at least one difference by way of an input-output map.