The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 11, 2012

Filed:

Sep. 02, 2009
Applicants:

Lan Zhou, Ankeny, IA (US);

Xiaoming Bao, Johnston, IA (US);

Inventors:

Lan Zhou, Ankeny, IA (US);

Xiaoming Bao, Johnston, IA (US);

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
C12Q 1/20 (2006.01); C12Q 1/54 (2006.01); C12P 7/06 (2006.01);
U.S. Cl.
CPC ...
Abstract

According to the invention, there is provided a high throughput method for measuring total fermentables using a small amount of plant tissue. A high throughput screening tool for gene discovery aiming for increasing total fermentables is further provided.


Find Patent Forward Citations

Zhou, Lan. (2012). High throughput method for measuring total fermentables in small amount of plant part (U.S. Patent No. 8329426). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/8329426

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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