The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 11, 2012
Filed:
Jun. 26, 2008
Mirko Lehmann, Ebnat-Kappel, CH;
Ingo Freund, Freiburg, DE;
Sonja Mohry, Freiburg, DE;
Holger Klapproth, Freiburg, DE;
Mirko Lehmann, Ebnat-Kappel, CH;
Ingo Freund, Freiburg, DE;
Sonja Mohry, Freiburg, DE;
Holger Klapproth, Freiburg, DE;
Micronas GmbH, Freiburg I.Br., DE;
Micronas Holding GmbH, Freiburg I. Br., DE;
Abstract
A measurement device has at least one sensor for detecting a parameter, a data storage unit, and a power supply for said sensor and data storage unit. In addition to the first sensor, the measurement device has at least one second sensor connected to the power supply and to the data storage unit. The second sensor is provided for detecting a physical quantity acting on the first sensor and is capable of permanently altering the measurement characteristic of the first sensor. An evaluator functions coactively with the second sensor and the data storage unit so that the permanent alteration of the measurement characteristic of the first sensor is recordable as a function of the measurement signal of the second sensor.