The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 11, 2012

Filed:

Oct. 26, 2009
Applicants:

Yeou-yen Cheng, Saratoga, CA (US);

Barry Linder, Danville, CA (US);

Willem Crone, Oroville, CA (US);

Yan Zhou, Pleasanton, CA (US);

Inventors:

Yeou-Yen Cheng, Saratoga, CA (US);

Barry Linder, Danville, CA (US);

Willem Crone, Oroville, CA (US);

Yan Zhou, Pleasanton, CA (US);

Assignee:

Clarity Medical Systems, Inc., Pleasanton, CA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
A61B 3/14 (2006.01); A61B 3/10 (2006.01);
U.S. Cl.
CPC ...
Abstract

An apparatus and method is disclosed that enables an existing handheld eye imaging device to do direct measurement on images taken from the patient eye. In a preferred embodiment, a reticle is arranged in the handheld eye imaging device so that a reticle image is superimposed on the object image. In addition to allowing the user to make measurements, the reticle superimposed eye image can also be used to align the eye with the handheld eye imaging device, be used for registering images taken at different times, and also be used for finding previously recorded points on the images for comparison purposes.


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