The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 11, 2012
Filed:
Aug. 25, 2009
Jason C. Caudill, Sunbury, OH (US);
Edward C. Maloof, Blacklick, OH (US);
Masaki Yamaguchi, Tokyo, JP;
Shin Mizuta, Osaka, JP;
Jason C. Caudill, Sunbury, OH (US);
Edward C. Maloof, Blacklick, OH (US);
Masaki Yamaguchi, Tokyo, JP;
Shin Mizuta, Osaka, JP;
Lake Shore Cryotronics, Inc., Westerville, OH (US);
Abstract
To eliminate or otherwise reduce unintended movement of a probe tip of a probe assembly being held by a probe arm, the probe assembly includes one or more resilient members that compensate for the contraction or expansion of the probe arm in accordance with the coefficient of thermal expansion of the material from which the probe arm is made. Thus, the probe tip can remain in contact with a sample being measured at the desired location on the sample, during an automated full or wide scale temperature range sweep.