The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 11, 2012

Filed:

Aug. 09, 2010
Applicants:

Ying Hsu, San Clemente, CA (US);

Gary Gottlieb, Irvine, CA (US);

Clint Kopper, Oceanside, CA (US);

Inventors:

Ying Hsu, San Clemente, CA (US);

Gary Gottlieb, Irvine, CA (US);

Clint Kopper, Oceanside, CA (US);

Assignee:

ISC8 Inc., Costa Mesa, CA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01C 19/56 (2006.01);
U.S. Cl.
CPC ...
Abstract

A signal processing method and device for measuring the input rate of an FM micro-gyro having a modulation frequency Fand having an oscillator sense element having a nominal frequency Fis disclosed. In a first aspect of the invention, the method comprises defining a first time interval Tand a second time interval Tand measuring the first time interval and the second time interval by counting the number of periods of a predetermined reference frequency. The nominal frequency of the oscillator sense element Fis measured along with the modulation frequency F. From these measurements, the proof mass period Nis calculated. The time difference Δt is calculated from the above measurements. The method then comprises calculating a modulation M that produced the measured Δt, preferably using an iterative method. From the above, the input rate Ω is calculated by dividing M by a sensitivity S of the FM micro-gyro. The above method and other methods for signal processing for measuring the input rate of an FM micro-gyro are disclosed herein.


Find Patent Forward Citations

Loading…